Main Page > MS (Physics) 2-Years Program (Regular) > APPLICATIONS OF X-RAY DIFFRACTION METHOD
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APPLICATIONS OF X-RAY DIFFRACTION METHOD
| Basics of crystallography: Crystal symmetry, symmetry operations, point groups, plane groups and space group, principles of X-ray diffraction, geometry of X-ray diffractometer, instrumentation, diffraction pattern, structure refinement, least-squares, Debye-Waller factor, Rietveld analysis, the March-Dollase approach, single and powder crystal diffraction methods, single crystal diffractometer, powder diffractometer, limitations of uses, recording powder diffraction pattern, qualitative and quantitative phase analysis, integrated intensities, various factors effecting shape of intensity peaks, crystal structure determination, systematic shift in peak positions, lattice parameter determination for crystal systems, Scherrer method, particle size determination, residual stress measurements through X-ray diffraction, pole figures and rocking curves, limitations of X-ray diffraction technique, Synchrotron radiation, dipole radiation, insertion devices, synchrotron radiation and X-ray flourescence analysis, metal-semiconductor interface study by X-ray synchrotron radiation, hard and soft X-ray synchrotron radiation, pair distribution function, nuclear resonant scattering, imaging the magnetic spin structure of magnetic layers, X-ray reflectivity at interfaces, synchrotron tomography |
| Credit hours/ Marks:- 3 |
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